In this testing system, the test is performed on test component in seven step sequence. The major criterion of this testing system is to twist the component and check the performance during and after twisting. Our task is to modify the Electrical Circuit and to improve the repeatability of the
Test Results (especially in LVDT ±30µm) in the system which was not satisfactory earlier.

To achieve the desired performance, we replaced the LVDT with FS ±1mm & with Wago Isolator of 0-10 VDC, the rerouting in wiring, adding Noise Filter and Fixture alignment resolve the problem and achieve the repeatability of LVDT with in ±18µm. Similarly we executes the similar projects successfully as per the Design Drawing Schematic from our Customers.